Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection. - Guang-Ming Zhang; David M. Harvey; Derek R. Braden (Microelectron. Reliab., 2006)

An automated ultrasonic inspection approach for flip chip solder joint assessment. - Ryan S. H. Yang; Derek R. Braden; Guang-Ming Zhang; David M. Harvey (Microelectron. Reliab., 2012)