An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias. - Gavin D. R. Hall; Derryl D. J. Allman (IRPS, 2015)

Reliability of an Al2O3/SiO2MIM Capacitor for 180nm (3.3V) Technology. - Jeff Gambino; Derryl D. J. Allman; Gavin D. R. Hall; D. Price; L. Sheng; R. Takada; Y. Kanuma (IRPS, 2019)

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. - Konner E. K. Holden; Gavin D. R. Hall; Michael Cook 004; Chris Kendrick; Kaitlyn Pabst; Bruce Greenwood; Robin Daugherty; Jeff P. Gambino; Derryl D. J. Allman (IRPS, 2021)

NBTI Characterization with in Situ Poly Heater. - Yu-Hsing Cheng; Michael Cook 004; Derryl D. J. Allman (IRPS, 2022)