How we test Siemens Embedded DRAM Cores. - Roderick McConnell; Udo Möller; Detlev Richter (ITC, 1998)

A Memory Specific Notation for Fault Modeling. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (Asian Test Symposium, 2001)

Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (ITC, 2001)

Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. - Zaid Al-Ars; Ad J. van de Goor; Jens Braun; Detlev Richter (DATE, 2003)

Funktionale Sicherheit von autonomen Transportsystemen in flexiblen I4.0 Fertigungsumgebungen. - Philip Kleen; Janis Albrecht; Jürgen Jasperneite; Detlev Richter (Echtzeit, 2018)