Modeling Reliability for Vehicle Platoon Communications: Heading out on Expressways. - Nitin Singh Rajput; Dev Vyas; Santosh Kumar Satapathy (GLOBECOM, 2023)

K-means Clustering with ANN based Classification to Predict Current-Voltage Characteristics of Advanced FETs. - Om Maheshwari; Dev Vyas; Nihar Ranjan Mohapatra (VLSID, 2024)