Compact modeling and simulation of accelerated circuit aging. - Devyani Patra; Jiayang Zhang; Runsheng Wang; Mehdi Katoozi; Ethan H. Cannon; Ru Huang 001; Yu Cao 001 (CICC, 2018)

Accelerated BTI degradation under stochastic TDDB effect. - Devyani Patra; Ahmed Kamal Reza; Mehdi Katoozi; Ethan H. Cannon; Kaushik Roy 001; Yu Cao 001 (IRPS, 2018)

Adaptive accelerated aging for 28 nm HKMG technology. - Devyani Patra; Ahmed Kamal Reza; Mohammad Khaled Hassan; Mehdi Katoozi; Ethan H. Cannon; Kaushik Roy 001; Yu Cao 001 (Microelectron. Reliab., 2018)