Improved Approach for Noise Propagation to Identify Functional Noise Violations. - Sachin Shrivastava; Dhanoop Varghese; Vikas Narang; N. V. Arvind (VLSI Design, 2004)

A comprehensive model for PMOS NBTI degradation: Recent progress. - Muhammad Ashraful Alam; Haldun Kufluoglu; Dhanoop Varghese; S. Mahapatra (Microelectron. Reliab., 2007)

TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions. - Federico Monti; Susanna Reggiani; Gaetano Barone; Elena Gnani; Antonio Gnudi; Giorgio Baccarani; Stefano Poli; Ming-Yeh Chuang; Weidong Tian; Dhanoop Varghese; Rick Wise (ESSDERC, 2014)

OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review. - Dhanoop Varghese; V. Reddy; S. Krishnan; Muhammad Ashraful Alam (Microelectron. Reliab., 2014)

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. - SangHoon Shin; Yen-Pu Chen; Woojin Ahn; Honglin Guo; Byron Williams; Jeff West; Tom Bonifield; Dhanoop Varghese; Srikanth Krishnan; Muhammad Ashraful Alam (IRPS, 2018)

Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture. - Davide Cornigli; Susanna Reggiani; Antonio Gnudi; Elena Gnani; Giorgio Baccarani; Davide Fabiani; Dhanoop Varghese; Enis Tuncer; S. Krishnan; Luu Nguyen (Microelectron. Reliab., 2018)

A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. - Yen-Pu Chen; Bikram Kishore Mahajan; Dhanoop Varghese; Srikanth Krishnan; Vijay Reddy; Muhammad Ashraful Alam (IRPS, 2020)

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. - Bikram Kishore Mahajan; Yen-Pu Chen; Dhanoop Varghese; Vijay Reddy; Srikanth Krishnan; Muhammad Ashraful Alam (IRPS, 2021)

A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. - Bikram Kishore Mahajan; Yen-Pu Chen; Muhammad Ashraful Alam; Dhanoop Varghese; Srikanth Krishnan; Vijay Reddy (IRPS, 2022)

Positive Bias Temperature Instability in Polysilicon/SiO2 PMOS Transistors for Analog High Precision Applications. - Dhanoop Varghese; Vijaya Vemuri; Arif Sonnet; Vijay Reddy; Srikanth Krishnan; Vivek Varier; Cheuk Yu; Srinivas Pulijala (IRPS, 2025)