Design methodology considering evolution of statistical corners under long term degradation. - Hossein Eslahi; Dhawal Mahajan; Sayed Ali Albahrani; Sourabh Khandelwal (Microelectron. J., 2019)

An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. - Hossein Eslahi; Sayed Ali Albahrani; Dhawal Mahajan; Sourabh Khandelwal (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)