Two CMOS Metastability Sensors. - Greg G. Freeman; Dick L. Liu; Bruce A. Wooley; Edward J. McCluskey (ITC, 1986)

Designing CMOS Circuits for Switch-Level Testability. - Dick L. Liu; Edward J. McCluskey (IEEE Des. Test, 1987)

Design of large embedded CMOS PLAs for built-in self-test. - Dick L. Liu; Edward J. McCluskey (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

An automatic test pattern generation program for large ASICs. - Dick L. Liu; Rajesh Galivanche; Charlie C. Hsu (ICCD, 1989)