An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. - Xhesila Xhafa; Ali Dogus Güngördü; Didem Erol; Yavuzhan Yavuz; Mustafa Berke Yelten (IEEE Trans. Instrum. Meas., 2021)

A highly-linear, sub-mW LNA at 2.4 GHz in 40 nm CMOS process. - Didem Erol; Mustafa Berke Yelten (Integr., 2023)