Non intrusive fault detection through electromagnetism analysis. - Sébastien Thomas; Didier Regis; David Faura; Marc Gatti; Guillaume Duc; Jean-Luc Danger (ETFA, 2011)

Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. - Thomas Rousselin; G. Hubert; Didier Regis; Marc Gatti; A. Bensoussan (Microelectron. Reliab., 2017)