Hot carrier aging degradation phenomena in GaN based MESFETs. - Fabiana Rampazzo; Roberto Pierobon; D. Pacetta; Christophe Gaquière; Didier Théron; Bertrand Boudart; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2004)

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. - Johannes Hoffmann; Sophie De Préville; Bruno Eckmann; Hung-Ju Lin; Benedikt Herzog; Kamel Haddadi; Didier Théron; Georg Gramse; Damien Richert; José Morán-Meza; François Piquemal (IEEE Trans. Instrum. Meas., 2024)