Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling. - Zhicheng Wu; Jacopo Franco; Dieter Claes; Gerhard Rzepa; Philippe J. Roussel; Nadine Collaert; Guido Groeseneken; Dimitri Linten; Tibor Grasser; Ben Kaczer (IRPS, 2019)

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. - Jakob Michl; Alexander Grill; Dieter Claes; Gerhard Rzepa; Ben Kaczer; Dimitri Linten; Iuliana P. Radu; Tibor Grasser; Michael Waltl (IRPS, 2020)

Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper. - Jacopo Franco; Hiroaki Arimura; J.-F. de Marneffe; A. Vandooren; L.-Å. Ragnarsson; Zhicheng Wu; Dieter Claes; E. Dentoni Litta; N. Horiguchi; Kris Croes; Dimitri Linten; Tibor Grasser; et al. (ICICDT, 2021)

Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies. - Gerhard Rzepa; Markus Karner; Oskar Baumgartner; Georg Strof; Franz Schanovsky; Ferdinand Mitterbauer; Christian Kernstock; Hui-Wen Karner; Pieter Weckx; Geert Hellings; Dieter Claes; Zhicheng Wu; et al. (IRPS, 2021)

Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. - Brecht Truijen; Barry J. O'Sullivan; Md. Nurul Alam; Dieter Claes; Mischa Thesberg; Philippe Roussel; Adrian Vaisman Chasin; Geert Van den Bosch; Ben Kaczer; Jan Van Houdt (IRPS, 2022)

Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations. - Dishant Sangani; Dieter Claes; Pieter Weckx; Ben Kaczer; Georges G. E. Gielen (IRPS, 2025)