Core Interconnect Testing Hazards. - Petra Nordholz; Hartmut Grabinski; Dieter Treytnar; Jan Otterstedt; Dirk Niggemeyer; Uwe Arz; T. W. Williams (DATE, 1998)

Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. - Petra Nordholz; Dieter Treytnar; Jan Otterstedt; Hartmut Grabinski; Dirk Niggemeyer; T. W. Williams (VTS, 1998)

A Multifunctional Laser Linking and Cutting Structure for Standard 0.25 mum CMOS-Technology. - Ole Mende; Michael Redeker; Markus Rudack; Dieter Treytnar (DFT, 2000)

Self-Configuration of a Large Area Integrated Multiprocessor System for Video Applications. - Markus Rudack; Michael Redeker; Dieter Treytnar; Ole Mende; Klaus Herrmann 002 (DFT, 2000)

EDA - Eine Voraussetzung für die Nanoelektronik. - Dieter Treytnar; Ralf Popp (it Inf. Technol., 2006)