Stress analyses of high spatial resolution on TSV and BEoL structures. - Dietmar Vogel; Ellen Auerswald; Jürgen Auersperg; Parisa Bayat; Raul D. Rodriguez; Dietrich R. T. Zahn; Sven Rzepka; Bernd Michel (Microelectron. Reliab., 2014)

Stress imaging in structural challenging MEMS with high sensitivity using micro-Raman spectroscopy. - Peter Meszmer; Raul D. Rodriguez; Evgeniya Sheremet; Dietrich R. T. Zahn; Bernhard Wunderle (Microelectron. Reliab., 2017)

Humidity Sensing Behavior of Endohedral Li-Doped and Undoped SWCNT/SDBS Composite Films. - Christian Müller 013; Ammar Al-Hamry; Olfa Kanoun; Mahfujur Rahaman; Dietrich R. T. Zahn; Elaine Yoshiko Matsubara; José Mauricio Rosolen (Sensors, 2019)