Effects of hot carriers in offset gated polysilicon thin-film transistors. - Argyrios T. Hatzopoulos; Dimitrios H. Tassis; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. - Dimitrios H. Tassis; Argyrios T. Hatzopoulos; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. - N. Arpatzanis; Argyrios T. Hatzopoulos; Dimitrios H. Tassis; C. A. Dimitriadis; François Templier; Maher Oudwan; G. Kamarinos (Microelectron. Reliab., 2008)

Characteristics of double-gate polycrystalline silicon thin-film transistors for AMOLED pixel design. - Ilias Pappas 001; Dimitrios H. Tassis; Stilianos Siskos; Charalambos A. Dimitriadis (ICECS, 2010)

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs. - Nikolaos Fasarakis; Andreas Tsormpatzoglou; Dimitrios H. Tassis; Konstantinos Papathanasiou; C. A. Dimitriadis; Gérard Ghibaudo (ICECS, 2012)

Variability of nanoscale triple gate FinFETs: Prediction and analysis method. - Dimitrios H. Tassis; Ioannis Messaris; Nikolaos Fasarakis; Andreas Tsormpatzoglou; Spiros Nikolaidis 001; C. A. Dimitriadis (ICECS, 2014)

A CMOS Threshold Voltage Monitoring Sensor. - Konstantinos Moustakas; Vasiliki Gogolou; Thomas Noulis; Dimitrios H. Tassis; Stylianos Siskos (MOCAST, 2023)