Analysis of transconductances at all levels of inversion in deep submicron CMOS. - Matthias Bucher; Dimitrios Kazazis; François Krummenacher; David M. Binkley; Daniel Foty; Yannis Papananos (ICECS, 2002)

Thermally-induced soft errors in nanoscale CMOS circuits. - Hua Li; Joseph L. Mundy; William R. Patterson; Dimitrios Kazazis; Alexander Zaslavsky; R. Iris Bahar (NANOARCH, 2007)