On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors. - Dimitrios N. Kouvatsos (Microelectron. Reliab., 2002)

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. - Dimitrios N. Kouvatsos; Vojkan Davidovic; George J. Papaioannou; Ninoslav Stojadinovic; Loukas Michalas; M. A. Exarchos; Apostolos T. Voutsas; Dimitrios Goustouridis (Microelectron. Reliab., 2004)

Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors. - Vojkan Davidovic; Dimitrios N. Kouvatsos; Ninoslav Stojadinovic; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. - F. V. Farmakis; Giannis P. Kontogiannopoulos; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. - Loukas Michalas; M. A. Exarchos; George J. Papaioannou; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. - Despina C. Moschou; M. A. Exarchos; Dimitrios N. Kouvatsos; George J. Papaioannou; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. - Despina C. Moschou; M. A. Exarchos; Dimitrios N. Kouvatsos; George J. Papaioannou; Aggeliki Arapoyanni; Apostolos T. Voutsas (Microelectron. Reliab., 2008)

On the importance of the Vg, max-Vth parameter on LTPS TFT stressing behavior. - Despina C. Moschou; Giannis P. Kontogiannopoulos; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2010)