Test quality and yield analysis using the DEFAM defect to fault mapper. - Dinesh D. Gaitonde; Duncan M. Hank Walker (ICCAD, 1993)

Estimation of reject ratio in testing of combinatorial circuits. - Dinesh D. Gaitonde; Jitendra Khare; D. M. H. Walker; Wojciech P. Maly (VTS, 1993)

Accurate yield estimation of circuits with redundancy. - Dinesh D. Gaitonde; D. M. H. Walker; Wojciech Maly (DFT, 1995)

Fatal Fault Probability Prediction for Array Based Designs. - Dinesh D. Gaitonde; Wojciech Maly; D. M. H. Walker (DFT, 1996)