Superior Endurance Performance of 22-nm Embedded MRAM Technology. - Vinayak Bharat Naik; J. H. Lim; K. Yamane; Dinggui Zeng; H. Yang; N. Thiyagarajah; Jae Hyun Kwon; N. L. Chung; R. Chao; T. Ling; K. Lee (IRPS, 2019)

Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. - Tae Young Lee; Kazutaka Yamane; Lee Yong Hau; Robin Chao; Nyuk Leong Chung; Vinayak Bharat Naik; K. Sivabalan; Jae Hyun Kwon; Jia Hao Lim; Wah-Peng Neo; Kevin Khua; Naganivetha Thiyagarajah; et al. (IRPS, 2020)