A Video Signal Processor for MIMD Multiprocessing. - Jörg Hilgenstock; Klaus Herrmann 002; Jan Otterstedt; Dirk Niggemeyer; Peter Pirsch (DAC, 1998)

Core Interconnect Testing Hazards. - Petra Nordholz; Hartmut Grabinski; Dieter Treytnar; Jan Otterstedt; Dirk Niggemeyer; Uwe Arz; T. W. Williams (DATE, 1998)

Detection of CMOS address decoder open faults with March and pseudo random memory tests. - Jan Otterstedt; Dirk Niggemeyer; T. W. Williams (ITC, 1998)

Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. - Petra Nordholz; Dieter Treytnar; Jan Otterstedt; Hartmut Grabinski; Dirk Niggemeyer; T. W. Williams (VTS, 1998)

Parametric Built-In Self-Test of VLSI Systems. - Dirk Niggemeyer; M. Rüffer (DATE, 1999)

Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM. - Markus Rudack; Dirk Niggemeyer (DFT, 1999)

Diagnostic Testing of Embedded Memories Using BIST. - Timothy J. Bergfeld; Dirk Niggemeyer; Elizabeth M. Rudnick (DATE, 2000)

Diagnostic Testing of Embedded Memories Based on Output Tracing. - Dirk Niggemeyer; Elizabeth M. Rudnick; Michael Redeker (MTDT, 2000)

Using GLFSRs for Pseudo-Random Memory BIST. - Michael Redeker; Markus Rudack; Thomas Lobbe; Dirk Niggemeyer (MTDT, 2000)

Automatic Generation of Diagnostic March Tests. - Dirk Niggemeyer; Elizabeth M. Rudnick (VTS, 2001)

Use of a field programmable gate array for education in manufacturing test and automatic test equipment. - Dirk Niggemeyer; Kevin J. Stephano; Elizabeth M. Rudnick (IEEE Trans. Educ., 2001)

A data acquisition methodology for on-chip repair of embedded memories. - Dirk Niggemeyer; Elizabeth M. Rudnick (ACM Trans. Design Autom. Electr. Syst., 2003)

Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing. - Dirk Niggemeyer; Elizabeth M. Rudnick (IEEE Trans. Computers, 2004)