Development of a standard for transient measurement of junction-to-case thermal resistance. - Heinz Pape; Dirk Schweitzer; Liu Chen; Rudolf Kutscherauer; Martin Walder (Microelectron. Reliab., 2012)

Thermal transient characterization of semiconductor devices with multiple heat sources - Fundamentals for a new thermal standard. - Dirk Schweitzer; Ferenc Ender; Gusztáv Hantos; Péter G. Szabó (Microelectron. J., 2015)