Detecting the overfilled status of domestic and commercial bins using computer vision. - Cathaoir Agnew; Dishant Mewada; Eoin Martino Grua; Ciarán Eising; Patrick Denny; Mark Heffernan; Ken Tierney; Pepijn van de Ven; Anthony G. Scanlan (Intell. Syst. Appl., 2023)

Contamination Detection From Highly Cluttered Waste Scenes Using Computer Vision. - Dishant Mewada; Cathaoir Agnew; Eoin Martino Grua; Ciarán Eising; Patrick Denny; Mark Heffernan; Ken Tierney; Pepijn van de Ven; Anthony G. Scanlan (IEEE Access, 2024)