Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation. - Javier Diaz-Fortuny; Dishant Sangani; Pablo Saraza-Canflanca; Erik Bury; Robin Degraeve; Ben Kaczer (IRPS, 2023)

The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper). - Dishant Sangani; Javier Diaz-Fortuny; Erik Bury; Ben Kaczer; Georges G. E. Gielen (IRPS, 2023)

Silent Data Corruption: Test or Reliability Problem? - Erik Jan Marinissen; Harish Dattatraya Dixit; Ronald Shawn Blanton; Aaron Kuo; Wei Li; Subhasish Mitra; Chris Nigh; Ruben Purdy; Ben Kaczer; Dishant Sangani; Pieter Weckx; Philippe J. Roussel; et al. (ETS, 2024)

Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers. - Dishant Sangani; Ben Kaczer; Pieter Weckx; Philippe J. Roussel; Subrat Mishra; Erik Jan Marinissen; Georges G. E. Gielen (IRPS, 2024)

Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. - Pablo Saraza-Canflanca; Dishant Sangani; Javier Diaz-Fortuny; Stanislav Tyaginov; Georges G. E. Gielen; Erik Bury; Ben Kaczer (IRPS, 2024)

Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations. - Dishant Sangani; Dieter Claes; Pieter Weckx; Ben Kaczer; Georges G. E. Gielen (IRPS, 2025)

A Carrier-Energy-Based Compact Model for Hot-Carrier Degradation Implemented in Verilog-A. - Dishant Sangani; Michiel Vandemaele; Stanislav Tyaginov; Erik Bury; Ben Kaczer; Georges G. E. Gielen (IRPS, 2025)