K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. - Wangqi Qiu; Jing Wang 006; D. M. H. Walker; Divya Reddy; Zhuo Li 001; Weiping Shi; Hari Balachandran (ITC, 2004)

Comparison of Delay Tests on Silicon. - Wangqi Qiu; D. M. H. Walker; Neil Simpson; Divya Reddy; Anthony Moore (ITC, 2006)