Reliability of Solid-State Drives Based on NAND Flash Memory. - Neal R. Mielke; Robert E. Frickey; Ivan Kalastirsky; Minyan Quan; Dmitry Ustinov; Venkatesh J. Vasudevan (Proc. IEEE, 2017)

Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories (Invited). - Robert Frickey; Joseph Doller; Robert Norton; Roman Sancho; Rakhshanda Sayyad; Dmitry Ustinov; Raymond Wang; Harvey Xu (IRPS, 2024)