Robust via-programmable ROM design based on 45nm process considering process variation and enhancement Vmin and yield. - Byung-Jun Jang; Chan-Ho Lee; Sung-Hun Sim; Kyu-Won Choi; Do-Hun Byun; Yeon-Ho Jung; Ki-Man Park; Dong-Yeon Heo; Gyu-Hong Kim; Joon-Sung Yang (ISCAS, 2015)