A case study on modeling and optimizing photolithography stage of semiconductor fabrication process. - Hyun-Jin Kim; Kwang-Jae Kim; Doh-Soon Kwak (Qual. Reliab. Eng. Int., 2010)

A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes. - Doh-Soon Kwak; Kwang-Jae Kim (Expert Syst. Appl., 2012)

Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. - Jiyoung Yoon; Bumgi Lee; Jaehee Song; Bokyoung Kang; Sangho Lee; Doh-Soon Kwak; Heonsang Lim; Ilsang Park; Jonghoon Kim; Sangwoo Pae (IRPS, 2023)