Automated Detection of Influential Patents Using Singular Values. - Dohyun Kim 005; Bangrae Lee; Hyuck Jai Lee; Sang Pil Lee; Yeongho Moon; Myong K. Jeong (IEEE Trans Autom. Sci. Eng., 2012)

A Graph Kernel Approach for Detecting Core Patents and Patent Groups. - Dohyun Kim 005; Bangrae Lee; Hyuck Jai Lee; Sang Pil Lee; Yeongho Moon; Myong Kee Jeong (IEEE Intell. Syst., 2014)

Inter-cluster connectivity analysis for technology opportunity discovery. - Byunghoon Kim; Gianluca Gazzola; Jae-Min Lee; Dohyun Kim 005; Kanghoe Kim; Myong K. Jeong (Scientometrics, 2014)

A Network Structural Approach to the Link Prediction Problem. - Chungmok Lee; Minh Pham; Myong Kee Jeong; Dohyun Kim 005; Dennis K. J. Lin; Wanpracha Art Chaovalitwongse (INFORMS J. Comput., 2015)

Robust kernel-based regression with bounded influence for outliers. - Sangheum Hwang; Dohyun Kim 005; Myong K. Jeong; Bong-Jin Yum (J. Oper. Res. Soc., 2015)

A robust support vector regression with a linear-log concave loss function. - Dohyun Kim 005; Chungmok Lee; Sangheum Hwang; Myong K. Jeong (J. Oper. Res. Soc., 2016)

Embedded variable selection method using signomial classification. - Kyoungmi Hwang; Dohyun Kim 005; Kyungsik Lee; Chungmok Lee; Sungsoo Park (Ann. Oper. Res., 2017)

A Scalable Feature Based Clustering Algorithm for Sequences with Many Distinct Items. - Sangheum Hwang; Dohyun Kim 005 (Int. J. Fuzzy Log. Intell. Syst., 2018)

Additive Ensemble Neural Networks. - Minyoung Park; Seungyeon Lee 002; Sangheum Hwang; Dohyun Kim 005 (IEEE Access, 2020)

Similarity based Deep Neural Networks. - Seungyeon Lee 002; Eunji Jo; Sangheum Hwang; Gyeong Bok Jung; Dohyun Kim 005 (Int. J. Fuzzy Log. Intell. Syst., 2021)

Decision Tree Algorithm Considering Distances Between Classes. - Sangyong Lee; Chulhee Lee; Kwon Gi Mun; Dohyun Kim 005 (IEEE Access, 2022)

Deep learning based recommender system using cross convolutional filters. - Seungyeon Lee 002; Dohyun Kim 005 (Inf. Sci., 2022)

Analysis of tabular data based on graph neural network using supervised contrastive loss. - Seungyeon Lee 002; Minyoung Park; Younggeun Ahn; Gyeong Bok Jung; Dohyun Kim 005 (Neurocomputing, 2024)

Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning. - Jeongjoon Hwang; Somi Ha; Dohyun Kim 005 (IEEE Access, 2025)