Optimization of Multi-Fins FinFET Implemented on SOI Wafer Based on SiGe and Gaussian Process Regression. - Christofer N. Yalung; Wittawat Yamwong; Doldet Tantraviwat (IEEE Access, 2024)

Dynamic Surrogate Optimization of Vertically Stacked Nanosheet FET Based on Gaussian Process Regression. - Christofer N. Yalung; Doldet Tantraviwat (IEEE Access, 2025)