Study of nanocrystal memory integration in a Flash-like NOR device. - Cosimo Gerardi; Salvatore Lombardo; Giuseppe Ammendola; Giovanni Costa; Valentina Ancarani; Domenico Mello; Stella Giuffrida; Maria Cristina Plantamura (Microelectron. Reliab., 2007)

Case study: Failure analysis for metal corrosion induced by pressure pot test. - Domenico Mello; R. Ricciari; M. Aiello; M. Astuto (Microelectron. Reliab., 2010)

Sample Preparation methodology for ultra thin oxide damage in Metal-Insulator-Metal capacitors. - Giancarlo Calvagno; Giuseppe Muni; Andrea Jossa; Domenico Mello (Microelectron. Reliab., 2012)

Fault isolation in a case study of failure analysis on Metal-Insulator-Metal capacitor structures. - V. Giuffrida; P. Barbarino; Giuseppe Muni; Giancarlo Calvagno; G. Latteo; Domenico Mello (Microelectron. Reliab., 2015)

Case study of failure analysis in thin film silicon solar cell. - Domenico Mello; R. Ricciari; A. Battaglia; Marina Foti; Cosimo Gerardi (Microelectron. Reliab., 2015)

Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. - R. Ricciari; E. P. Ferlito; G. Pizzo; M. Padalino; G. Anastasi; M. Sacchi; G. Pappalardo; C. Consalvo; Domenico Mello (Microelectron. Reliab., 2015)

Silicon photomultipliers with embedded optical filters for wearable healthcare applications. - Massimo Mazzillo; Domenico Mello; Pietro Paolo Barbarino; Vincenzo Vinciguerra; Giorgio Fallica; Sebania Libertino; Antonella Sciuto; Salvatore Lombardo; Yuri Musienko (IEEE SENSORS, 2017)