Accurate Multi-cycle ATPG in Presence of X-Values. - Dominik Erb; Michael A. Kochte; Matthias Sauer 002; Hans-Joachim Wunderlich; Bernd Becker 001 (Asian Test Symposium, 2013)

Accurate QBF-based test pattern generation in presence of unknown values. - Stefan Hillebrecht; Michael A. Kochte; Dominik Erb; Hans-Joachim Wunderlich; Bernd Becker 001 (DATE, 2013)

Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. - Dominik Erb; Karsten Scheibler; Matthias Sauer 002; Sudhakar M. Reddy; Bernd Becker 001 (ATS, 2014)

Efficient SMT-based ATPG for interconnect open defects. - Dominik Erb; Karsten Scheibler; Matthias Sauer 002; Bernd Becker 001 (DATE, 2014)

Test pattern generation in presence of unknown values based on restricted symbolic logic. - Dominik Erb; Karsten Scheibler; Michael A. Kochte; Matthias Sauer 002; Hans-Joachim Wunderlich; Bernd Becker 001 (ITC, 2014)

Exact Logic and Fault Simulation in Presence of Unknowns. - Dominik Erb; Michael A. Kochte; Matthias Sauer 002; Stefan Hillebrecht; Tobias Schubert 001; Hans-Joachim Wunderlich; Bernd Becker 001 (ACM Trans. Design Autom. Electr. Syst., 2014)

Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. - Karsten Scheibler; Dominik Erb; Bernd Becker 001 (ETS, 2015)

Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. - Dominik Erb; Karsten Scheibler; Matthias Sauer 002; Sudhakar M. Reddy; Bernd Becker 001 (VTS, 2015)

Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. - Dominik Erb; Michael A. Kochte; Sven Reimer; Matthias Sauer 002; Hans-Joachim Wunderlich; Bernd Becker 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. - Dominik Erb; Karsten Scheibler; Michael A. Kochte; Matthias Sauer 002; Hans-Joachim Wunderlich; Bernd Becker 001 (ASP-DAC, 2016)

Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. - Karsten Scheibler; Dominik Erb; Bernd Becker 001 (DATE, 2016)

Applying Tailored Formal Methods to X-ATPG. - Karsten Scheibler; Dominik Erb; Bernd Becker 001 (MBMV, 2016)

On the handling of uncertainty in test pattern generation. - Dominik Erb (Der Andere Verlag, 2016)

Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG. - Jan Burchard; Dominik Erb; Adit D. Singh; Sudhakar M. Reddy; Bernd Becker 001 (DATE, 2017)

Evaluating the effectiveness of D-chains in SAT-based ATPG. - Jan Burchard; Felix Neubauer; Pascal Raiola; Dominik Erb; Bernd Becker 001 (LATS, 2017)

Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. - Pascal Raiola; Dominik Erb; Sudhakar M. Reddy; Bernd Becker 001 (VLSID, 2017)

Efficient SAT-based generation of hazard-activated TSOF tests. - Jan Burchard; Dominik Erb; Sudhakar M. Reddy; Adit D. Singh; Bernd Becker 001 (VTS, 2017)

Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG. - Pascal Raiola; Jan Burchard; Felix Neubauer; Dominik Erb; Bernd Becker 001 (J. Electron. Test., 2017)

Characterization of possibly detected faults by accurately computing their detection probability. - Jan Burchard; Dominik Erb; Bernd Becker 001 (DATE, 2018)

On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. - Jan Burchard; Dominik Erb; Sudhakar M. Reddy; Adit D. Singh; Bernd Becker 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)