CMOS Standard Cells Characterization for Defect Based Testing. - Witold A. Pleskacz; Dominik Kasprowicz; Tomasz Oleszczak; Wieslaw Kuzmicz (DFT, 2001)

Improvement of integrated circuit testing reliability by using the defect based approach. - Dominik Kasprowicz; Witold A. Pleskacz (Microelectron. Reliab., 2003)

Is there always performance overhead for regular fabric? - Yi-Wei Lin; Malgorzata Marek-Sadowska; Wojciech Maly; Andrzej Pfitzner; Dominik Kasprowicz (ICCD, 2008)

Adder Circuits with Transistors using Independently Controlled Gates. - Marcus Weis; Andrzej Pfitzner; Dominik Kasprowicz; Rainer Emling; Wojciech Maly; Doris Schmitt-Landsiedel (ISCAS, 2009)

VeSFET as an analog-circuit component. - Dominik Kasprowicz; Bartosz Swacha (DDECS, 2013)

Computer-aided detection of plagiarism in integrated-circuit layouts. - Dominik Kasprowicz; Hilekaan Wada (MIXDES, 2013)

Methods for automated detection of plagiarism in integrated-circuit layouts. - Dominik Kasprowicz; Hilekaan Wada (Microelectron. J., 2014)

Channel charge model of a dual-gate junctionless transistor. - Dominik Kasprowicz (MIXDES, 2015)

Variability-aware table-based DC model of a dual-gate transistor. - Dominik Kasprowicz (MIXDES, 2017)

Semiconductor Device Parameter Extraction Based on I-V Measurements and Simulation. - Dominik Kasprowicz (MIXDES, 2019)

Table-Based Model of a Dual-Gate Transistor for Statistical Circuit Simulation. - Dominik Kasprowicz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)