Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. - R. Petersen; Ward De Ceuninck; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2001)

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. - R. Petersen; Ward De Ceuninck; Jan D'Haen; Marc D'Olieslaeger; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2002)