Weighted H∞ filtering versus observation: Application to signal differentiation. - Mehdi Dridi; Gérard Scorletti; Dominique Tournier; Mohamed Smaoui; Xuefang Lin-Shi (ACC, 2010)

Analysis of an ESD failure mechanism on a SiC MESFET. - Tanguy Phulpin; David Trémouilles; Karine Isoird; Dominique Tournier; Philippe Godignon; Patrick Austin (Microelectron. Reliab., 2014)

Failure analysis of ESD-stressed SiC MESFET. - Tanguy Phulpin; David Trémouilles; Karine Isoird; Dominique Tournier; Philippe Godignon; Patrick Austin (Microelectron. Reliab., 2015)

SiC Integrated Circuit Control Electronics for High-Temperature Operation. - Mihaela Alexandru; Viorel Banu; Xavier Jordà; Josep Montserrat; Miquel Vellvehí; Dominique Tournier; José Millán; Philippe Godignon (IEEE Trans. Ind. Electron., 2015)