Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration. - Jie Gu; Donald Barker; Michael G. Pecht (AAAI Fall Symposium: Artificial Intelligence for Prognostics, 2007)

Prognostics implementation of electronics under vibration loading. - Jie Gu; Donald Barker; Michael G. Pecht (Microelectron. Reliab., 2007)

Simplified terrain identification and component fatigue damage estimation model for use in a health and usage monitoring system. - Richard Heine; Donald Barker (Microelectron. Reliab., 2007)

Model for life prediction of fatigue-creep interaction. - Ricky Valentin; Donald Barker; Michael D. Osterman (Microelectron. Reliab., 2008)

Rapid assessment of BGA life under vibration and bending, and influence of input parameter uncertainties. - Mei-Ling Wu; Donald Barker (Microelectron. Reliab., 2010)