Electrical and structural dependence of operating temperature of AlGaN/GaN HEMTs. - Eric Heller; Sukwon Choi; Donald Dorsey; Ramakrishna Vetury; Samuel Graham (Microelectron. Reliab., 2013)

Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects. - Jason P. Jones; Eric Heller; Donald Dorsey; Samuel Graham (Microelectron. Reliab., 2015)