Serial Interfaces for Minicomputers. - Donald E. Troxel (IEEE Trans. Computers, 1975)

Feature selection for low error rate OCR. - Donald E. Troxel (Pattern Recognit., 1976)

An Interactive Image Processing System. - Donald E. Troxel (IEEE Trans. Pattern Anal. Mach. Intell., 1981)

Application of Pseudorandom Noise to DPCM. - Donald E. Troxel (IEEE Trans. Commun., 1981)

A Two-Channel Picture Coding System: I-Real-Time Implementation. - Donald E. Troxel; William F. Schreiber; Robert P. Bishop; Robert R. Buckley; Geoffrey J. Bunza; Takeo Eguchi; Samuel M. Goldwasser; Joel E. Jakubson; Jung-Shu Kung; Dennis Ng; Sohei Takemoto; Eiichi Yokoyama (IEEE Trans. Commun., 1981)

Automated Engraving of Gravure Cylinders. - Donald E. Troxel; William F. Schreiber; Samuel M. Goldwasser; Malik M. A. Khan; Len Picard; Michael A. Ide; Carolyn J. Turcio (IEEE Trans. Syst. Man Cybern., 1981)

Scaling Binary Images with the Telescoping Template. - Robert Ulichney; Donald E. Troxel (IEEE Trans. Pattern Anal. Mach. Intell., 1982)

Page composition of continuous tone imagery. - Samuel M. Goldwasser; Donald E. Troxel (Comput. Vis. Graph. Image Process., 1984)

Transformation Between Continuous and Discrete Representations of Images: A Perceptual Approach. - William F. Schreiber; Donald E. Troxel (IEEE Trans. Pattern Anal. Mach. Intell., 1985)

Making Progressive Transmission Adaptive. - William D. Hofmann; Donald E. Troxel (IEEE Trans. Commun., 1986)

A Comprehensive Layout Methodology and Layout-Specific Circuit Analyses for Three-Dimensional Integrated Circuits. - Syed M. Alam; Donald E. Troxel; Carl V. Thompson (ISQED, 2002)

A dithering algorithm for local composition control with three-dimensional printing. - Wonjoon Cho; Emanuel M. Sachs; Nicholas M. Patrikalakis; Donald E. Troxel (Comput. Aided Des., 2003)

Circuit Level Reliability Analysis of Cu Interconnects. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2004)

Thermal aware cell-based full-chip electromigration reliability analysis. - Syed M. Alam; Donald E. Troxel; Carl V. Thompson (ACM Great Lakes Symposium on VLSI, 2005)

Electromigration Reliability Comparison of Cu and Al Interconnects. - Syed M. Alam; Frank L. Wei; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2005)

A 3-D FPGA wire resource prediction model validated using a 3-D placement and routing tool. - Young-Su Kwon; Payam Lajevardi; Anantha P. Chandrakasan; Frank Honoré; Donald E. Troxel (SLIP, 2005)

Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (Microelectron. J., 2007)