The Series/1 as a Test System Controller for System Verification and Calibration. - Donald L. Wheater; Richard Soderman (ITC, 1981)

IBM's Cost Performance Array Tester Architecture for the 80's. - Donald L. Wheater (ITC, 1984)

Low-Cost Testing of High-Density Logic Components. - Robert W. Bassett; Barry J. Butkus; Stephen L. Dingle; Marc R. Faucher; Pamela S. Gillis; Jeannie H. Panner; John G. Petrovick; Donald L. Wheater (IEEE Des. Test Comput., 1990)

ASIC Test Cost/Strategy Trade-offs. - Donald L. Wheater; Phil Nigh; Jeanne Trinko Mechler; Luke Lacroix (ITC, 1994)

Will 0.1um Digital Circuits Require Mixed-Signal Testing. - Melvin A. Breuer; Bozena Kaminska; John E. McDermid; V. Rayapathi; Donald L. Wheater (VTS, 1997)

A SmartBIST Variant with Guaranteed Encoding. - Bernd Könemann; Carl Barnhart; Brion L. Keller; Thomas J. Snethen; Owen Farnsworth; Donald L. Wheater (Asian Test Symposium, 2001)

Test Trade-Offs Take Center Stage at ITC. - Tony Ambler; Donald L. Wheater (IEEE Des. Test Comput., 2001)

On-Chip Repair and an ATE Independent Fusing Methodology. - Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (ITC, 2002)

A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? - Lee Song; Rudy Garcia; Andrew Levy; Donald L. Wheater (VTS, 2002)

Guest Editors' Introduction: Stressing the Fundamentals. - Robert C. Aitken; Donald L. Wheater (IEEE Des. Test Comput., 2002)

ATE-Customer Perspectives & Requirements Panel. - Donald L. Wheater (ITC, 2003)

An On-Chip Self-Repair Calculation and Fusing Methodology. - Darren Anand; Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (IEEE Des. Test Comput., 2003)