First- and Second-Order Stress Effects on the Superconducting Transitions of Tantalum and Tin. - Donald P. Seraphim; Paul M. Marcus (IBM J. Res. Dev., 1962)

Electrochemical Phenomena in Thin Films of Silicon Dioxide on Silicon. - Donald P. Seraphim; Andrew E. Brennemann; Francois Max d'Heurle; Harold L. Friedman (IBM J. Res. Dev., 1964)

Surface Effects on Silicon: Introduction. - Donald R. Young; Donald P. Seraphim (IBM J. Res. Dev., 1964)

Approaches toward ultralarge FPDs. - J. Peter Krusius; Donald P. Seraphim; Raymond G. Greene; Dean S. Skinner; Boris Yost (Proc. IEEE, 2002)