Feasibility of monolithic and 3D-stacked DC-DC converters for microprocessors in 90nm technology generation. - Gerhard Schrom; Peter Hazucha; Jae-Hong Hahn; Volkan Kursun; Donald S. Gardner; Siva G. Narendra; Tanay Karnik; Vivek De (ISLPED, 2004)

A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package. - Peter Hazucha; Gerhard Schrom; Jaehong Hahn; Bradley A. Bloechel; Paul Hack; Gregory E. Dermer; Siva G. Narendra; Donald S. Gardner; Tanay Karnik; Vivek De; Shekhar Borkar (IEEE J. Solid State Circuits, 2005)

High-frequency DC-DC conversion : fact or fiction. - Tanay Karnik; Peter Hazucha; Gerhard Schrom; Fabrice Paillet; Donald S. Gardner (ISCAS, 2006)

A Linear Regulator with Fast Digital Control for Biasing Integrated DC-DC Converters. - Peter Hazucha; Sung Tae Moon; Gerhard Schrom; Fabrice Paillet; Donald S. Gardner; Saravanan Rajapandian; Tanay Karnik (ISSCC, 2006)

Low Voltage Buffered Bandgap Reference. - Peter Hazucha; Fabrice Paillet; Sung Tae Moon; David J. Rennie; Gerhard Schrom; Donald S. Gardner; Kenneth Ikeda; Gell Gellman; Tanay Karnik (ISQED, 2007)

High Voltage Tolerant Linear Regulator With Fast Digital Control for Biasing of Integrated DC-DC Converters. - Peter Hazucha; Sung Tae Moon; Gerhard Schrom; Fabrice Paillet; Donald S. Gardner; Saravanan Rajapandian; Tanay Karnik (IEEE J. Solid State Circuits, 2007)

Overcoming Early-Life Failure and Aging for Robust Systems. - Yanjing Li; Young Moon Kim; Evelyn Mintarno; Donald S. Gardner; Subhasish Mitra (IEEE Des. Test Comput., 2009)

Design techniques for cross-layer resilience. - Nicholas P. Carter; Helia Naeimi; Donald S. Gardner (DATE, 2010)

QED: Quick Error Detection tests for effective post-silicon validation. - Ted Hong; Yanjing Li; Sung-Boem Park; Diana Mui; David Lin; Ziyad Abdel Kaleq; Nagib Hakim; Helia Naeimi; Donald S. Gardner; Subhasish Mitra (ITC, 2010)

Concurrent autonomous self-test for uncore components in system-on-chips. - Yanjing Li; Onur Mutlu; Donald S. Gardner; Subhasish Mitra (VTS, 2010)

Integrated inductors with magnetic materials for on-chip power conversion. - Donald S. Gardner; Gerhard Schrom; Fabrice Paillet; Tanay Karnik; Shekhar Borkar (Hot Chips Symposium, 2011)

Bug localization techniques for effective post-silicon validation. - Subhasish Mitra; David Lin; Nagib Hakim; Donald S. Gardner (ASP-DAC, 2012)

Overcoming post-silicon validation challenges through quick error detection (QED). - David Lin; Ted Hong; Yanjing Li; Farzan Fallah; Donald S. Gardner; Nagib Hakim; Subhasish Mitra (DATE, 2013)

Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. - David Lin; Ted Hong; Yanjing Li; Eswaran S; Sharad Kumar; Farzan Fallah; Nagib Hakim; Donald S. Gardner; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)