Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade; G. Vanderschaeve (Microelectron. Reliab., 2009)

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade (Microelectron. Reliab., 2010)

Universal mechanisms of Al metallization ageing in power MOSFET devices. - Donatien Martineau; Colette Levade; Marc Legros; Philippe Dupuy; Thomas Mazeaud (Microelectron. Reliab., 2014)

Identification and analysis of power substrates degradations subjected to severe aging tests. - Eric Woirgard; Faical Arabi; Wissam Sabbah; Donatien Martineau; L. Théolier; Stephane Azzopardi (Microelectron. Reliab., 2015)

Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. - Faical Arabi; Loic Théolier; Donatien Martineau; Jean-Yves Delétage; M. Medina; Eric Woirgard (Microelectron. Reliab., 2016)