Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory. - Dong Chan Lee; Jang Kyu Lee; Hyungcheol Shin (IEICE Electron. Express, 2020)

Transient program operation model considering distribution of electrons in 3D NAND flash memories. - Dong Chan Lee; Hyungcheol Shin (IEICE Electron. Express, 2020)

Weak saliency ensemble network for person Re-identification using infrared light images. - Min Su Jeong; Seong In Jeong; Dong Chan Lee; Seung Yong Jung; Kang Ryoung Park (Eng. Appl. Artif. Intell., 2025)