Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition. - Shi-Shun Chen; Dong-Hua Niu; Wen-Bin Chen; Jiayun Song; Yafei Zhang; Xiao-Yang Li 001; Enrico Zio (IEEE Trans. Reliab., 2026)