18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O test scheme. - Young Jun Yoon; Byung Deuk Jeon; Byung Soo Kim; Ki Up Kim; Tae Yong Lee; Nohhyup Kwak; Woo-Yeol Shin; Na Yeon Kim; Yunseok Hong; Kyeong Pil Kang; Dong Yoon Ka; Seong Ju Lee; et al. (ISSCC, 2016)