Comparative Study on SRAMs for Suppressing Both Oxide-Tunneling Leakage and Subthreshold Leakage in Sub-70-nm Leakage Dominant VLSIs. - Duk-Hyung Lee; Dong-Kone Kwak; Kyeong-Sik Min (VLSI Design, 2007)

Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes. - Duk-Hyung Lee; Dong-Kone Kwak; Kyeong-Sik Min (J. Comput., 2008)