Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. - Dong S. Suk; Sudhakar M. Reddy (IEEE Trans. Computers, 1980)

A March Test for Functional Faults in Semiconductor Random Access Memories. - Dong S. Suk; Sudhakar M. Reddy (IEEE Trans. Computers, 1981)

Traffic Service Position System No. 1B: Capacity and reliability evaluation. - Bently A. Crane; Dong S. Suk (Bell Syst. Tech. J., 1983)