Layout-Based Dual-Cell-Aware Tests. - Tse-Wei Wu; Dong-Zhen Lee; Yu-Hao Huang; Mango C.-T. Chao; Kai-Chiang Wu; Shu-Yi Kao; Ying-Yen Chen; Po-Lin Chen; Mason Chern; Jih-Nung Lee (VTS, 2019)

Improving Cell-Aware Test for Intra-Cell Short Defects. - Dong-Zhen Lee; Ying-Yen Chen; Kai-Chiang Wu; Mango C.-T. Chao (DATE, 2022)

Methodology of Generating Timing-Slack-Based Cell-Aware Tests. - Yu-Teng Nien; Kai-Chiang Wu; Dong-Zhen Lee; Ying-Yen Chen; Po-Lin Chen; Mason Chern; Jih-Nung Lee; Shu-Yi Kao; Mango Chia-Tso Chao (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)