Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. - Seonhaeng Lee; Cheolgyu Kim; Hyeokjin Kim; Gang-Jun Kim; Ji-Hoon Seo; Donghee Son; Bongkoo Kang (Microelectron. Reliab., 2013)

Degradation of pMOSFETs due to hot electron induced punchthrough. - Donghee Son; Gang-Jun Kim; Ji-Hoon Seo; Nam-Hyun Lee; YongHa Kang; Bongkoo Kang (Microelectron. Reliab., 2016)

Channel width dependence of AC stress on bulk nMOSFETs. - Donghee Son; Gang-Jun Kim; Ji-Hoon Seo; Nam-Hyun Lee; YongHa Kang; Bongkoo Kang (Microelectron. Reliab., 2016)

Towards the Development of Bidirectional Peripheral Nerve Interface for Long-term Implantation. - HyungDal Park; Wonsuk Choi 002; Woohyun Jung; Ockchul Kim; Jun-Uk Chu; Donghee Son; Jong Woong Park; Jinseok Kim 002 (CBS, 2018)

Unified Cox model based multifactor dimensionality reduction method for gene-gene interaction analysis of the survival phenotype. - Seungyeoun Lee; Donghee Son; Yongkang Kim; Wenbao Yu; Taesung Park (BioData Min., 2018)

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability. - Yeohyeok Yun; Gang-Jun Kim; Ji-Hoon Seo; Donghee Son; Bongkoo Kang (Microelectron. Reliab., 2018)

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. - Yeohyeok Yun; Ji-Hoon Seo; Donghee Son; Bongkoo Kang (Microelectron. Reliab., 2018)

NTIRE 2019 Challenge on Real Image Super-Resolution: Methods and Results. - Jianrui Cai; Shuhang Gu; Radu Timofte; Lei Zhang 006; Xiao Liu 022; Yukang Ding; Dongliang He; Chao Li 034; Yi Fu; Shilei Wen; Ruicheng Feng; Jinjin Gu; et al. (CVPR Workshops, 2019)

Fractal Residual Network and Solutions for Real Super-Resolution. - Junhyung Kwak; Donghee Son (CVPR Workshops, 2019)

Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. - Nam-Hyun Lee; Jongkyun Kim; Donghee Son; Kangjun Kim; Jung Eun Seok (IRPS, 2019)

Noise Conditional Flow Model for Learning the Super-Resolution Space. - Younggeun Kim; Donghee Son (CVPR Workshops, 2021)

Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. - Donghee Son; Gang-Jun Kim; Jongkyun Kim; Nam-Hyun Lee; Kijin Kim; Sangwoo Pae (IRPS, 2021)

Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection. - Sangho Yu; Sang Min Won; Hyoung Won Baac; Donghee Son; Changhwan Shin (IEEE Access, 2022)

Strain-Dependent Photoacoustic Characteristics of Free-Standing Carbon-Nanocomposite Transmitters. - Muhammad Faraz; Muhammad Awais Abbasi; Donghee Son; Changhwan Shin; Kyu-Tae Lee; Sang Min Won; Hyoung Won Baac (Sensors, 2022)