A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. - Jaegyeong Cha; Seokju Oh; Donghyun Kim 005; Jongpil Jeong (IDSTA, 2020)

AnoGAN-Based Anomaly Filtering for Intelligent Edge Device in Smart Factory. - Donghyun Kim 005; Jaegyeong Cha; Seokju Oh; Jongpil Jeong (IMCOM, 2021)

Design and Performance Analysis for Edge Intelligence-Based F-PMIPv6 Mobility Support for Smart Manufacturing. - Donghyun Kim 005; Byungjun Park; Junhyung Moon 002; Jaeen Lee; Jongpil Jeong (Wirel. Commun. Mob. Comput., 2021)

Abnormal Data Classification Based on SSA-AELSTM. - Donghyun Kim 005; Seokju Oh; Jeongdae Kim; Jongpil Jeong (ICCSCI, 2023)