Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. - Duhyun Jeon; Dongmin Lee 007; Dong Kyue Kim; Byong-Deok Choi (HOST, 2022)

A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio. - Duhyun Jeon; Dongmin Lee 007; Dong Kyue Kim; Byong-Deok Choi (IEEE J. Solid State Circuits, 2023)